Voltage monitor using a capacitive digital-to-analog converter

ABSTRACT

One example relates to a monitoring circuit that includes a capacitive digital-to-analog converter that receives a binary code, a reference voltage, a monitored voltage, and a ground reference, the capacitive digital-to-analog converter outputting an analog signal based on the binary code, the reference voltage, the monitored voltage, and the ground reference. The monitoring circuit further includes a comparator including a first input coupled to receive the analog signal and a second input coupled to the reference voltage, the comparator comparing the analog signal to the reference voltage and outputting a comparator signal based on the comparison. The monitoring circuit yet further includes a binary code generator that generates the binary code based on the comparator signal, the binary code approximating a magnitude of the monitored voltage.

TECHNICAL FIELD

This disclosure relates generally to monitoring, and more specificallyto voltage monitoring.

BACKGROUND

Laptop computers, tablet computers, cellular telephones, and otherdevices are increasingly utilizing battery power for portability. Suchdevices monitor a charge state of their batteries as a basis to conservepower and provide an indication as to when to charge the batteries. Toperform such monitoring, these devices employ a battery monitor. Tominimize impact on the battery that it is monitoring, this batterymonitor minimizes an amount of power that it is drawing from thebattery. Additionally, such devices are being further reduced in size toincrease portability. This push to produce smaller and smaller deviceslimits an amount of space within these devices for the battery monitor.Some such devices employ resistor dividers to monitor their batteries,but such resistor dividers take up a relatively large area to minimizecurrent drawn by the battery monitor.

SUMMARY

One example relates to a monitoring circuit that includes a capacitivedigital-to-analog converter that receives a binary code, a referencevoltage, a monitored voltage, and a ground reference, the capacitivedigital-to-analog converter outputting an analog signal based on thebinary code, the reference voltage, the monitored voltage, and theground reference. The monitoring circuit further includes a comparatorincluding a first input coupled to receive the analog signal and asecond input coupled to the reference voltage, the comparator comparingthe analog signal to the reference voltage and outputting a comparatorsignal based on the comparison. The monitoring circuit yet furtherincludes a binary code generator that generates the binary code based onthe comparator signal, the binary code approximating a magnitude of themonitored voltage.

Another example relates to a method that includes selectively receivinga monitored voltage at an input of a capacitive digital-to-analogconverter. The method further includes producing an analog signal withthe capacitive digital-to-analog converter based on a binary code andthe monitored voltage. The method further includes comparing the analogsignal to a reference voltage in accordance with a clock signal. Themethod further includes producing the binary code based on thecomparison of the analog signal to the reference voltage, the binarycode approximating a magnitude of the monitored voltage.

Another example relates to another monitoring device that includes aplurality of capacitors connected in parallel with each other, each ofthe plurality of capacitors being selectively coupled to or decoupledfrom a ground reference in accordance with a binary code to provide ananalog signal. The monitoring device further includes a plurality ofswitch devices to selectively couple and decouple the each of theplurality of capacitors to/from the ground reference in accordance withthe binary code. The monitoring device further includes a comparatorincluding a first input coupled to receive the analog signal and asecond input coupled to a reference voltage, the comparator comparingthe analog signal to the reference voltage and outputting a comparatorsignal based on the comparison. The monitoring device further includes abinary code generator that generates the binary code based on thecomparator signal, the binary code approximating a magnitude of themonitored voltage.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an example monitoring device that monitors a voltage.

FIG. 2 illustrates another example monitoring device that monitors avoltage.

FIG. 3 illustrates yet another example monitoring device that monitors avoltage.

FIG. 4 illustrates yet another example monitoring circuit that monitorsa voltage.

FIG. 5 illustrates an example waveform timing diagram for the monitoringcircuit illustrated in FIG. 2.

FIG. 6 illustrates an example method of monitoring a voltage.

DETAILED DESCRIPTION

The disclosure relates to a monitoring circuits, devices, and methodsfor monitoring a voltage. As an example, the monitoring circuit includesa capacitive digital-to-analog converter that receives a binary code, areference voltage, a monitored voltage, and a ground reference. Thecapacitive digital-to-analog converter outputs an analog signal based onthe binary code, the reference voltage, the monitored voltage, and theground reference. The monitoring circuit further includes a comparatorincluding a first input coupled to receive the analog signal and asecond input coupled to the reference voltage. The comparator comparesthe analog signal to the reference voltage and outputting a comparatorsignal based on the comparison. The monitoring circuit also includes abinary code generator that generates the binary code based on thecomparator signal, such that the binary code approximates a magnitude ofthe monitored voltage.

Such a monitoring circuit may be implemented to continuously monitor abattery voltage, which allows for better power management for devicesutilizing the monitoring circuit to monitor battery power. Such powermanagement may include selective powering of other devices and/or timingwhen such other devices are powered.

FIG. 1 illustrates an example monitoring circuit 100 that monitors avoltage. The monitoring circuit 100 includes a capacitivedigital-to-analog converter (C-DAC) 110. The C-DAC 110 receives a binarycode or a “B code”, a reference voltage Vref, a monitored voltage Vin,and a ground reference VSS. The C-DAC 110 outputs an analog signal basedon the B code. In an example, the C-DAC 110 is a capacitivevoltage-divider DAC. The C-DAC 110 includes an input that receives thereference voltage Vref to pre-charge capacitors of the C-DAC 110. TheC-DAC 110 includes another input that receives the monitored voltageVin. In an example, the monitored voltage Vin is a battery voltage thatis being monitored. In an example, Vin is greater than Vref. In anotherexample, monitored voltage Vin is less than reference voltage Vref. Inyet another example, monitored voltage Vin is approximately equal toreference voltage Vref. The C-DAC 110 further includes another inputthat is coupled to the ground reference VSS. In an example, the groundreference VSS is a system ground. The C-DAC 110 further includes yetanother input on which it received the B code. The C-DAC 110 includes anoutput, with the C-DAC 110 outputting an analog signal Vdiv on theoutput in accordance with the B code. This B code controls whetherindividual capacitors of the C-DAC 110 are selectively coupled anddecoupled to/from either the reference voltage Vref, the monitoredvoltage Vin, or the ground reference VSS. The C-DAC 110 includes asampling phase and a conversion phase, with the sampling and theconversion phases performed in accordance with the B code.

The monitoring circuit 100 further includes a comparator 120. Thecomparator 120 includes a first input coupled to receive the analogsignal Vdiv from the C-DAC 110 and a second input coupled to thereference voltage Vref. The comparator 120 compares the analog signalVdiv to the reference voltage Vref and outputs a comparator signal basedon the comparison. In an example, the comparator 120 is an edge-basedclock-based comparator. A positive input of the comparator 120 iscoupled to the output of the C-DAC 110 and a negative input of thecomparator 120 is coupled to one side of a capacitor Cl, which ispre-charged to the reference voltage Vref. The other side of thecapacitor C 1 is coupled to the reference voltage Vref to pre-charge thecapacitor C1 to the ground reference VSS. The comparator 120 includes anoutput to output a comparator signal, e.g., either a logic high signalor a logic low signal, in accordance with a comparison of the voltagesreceived on the two inputs of the comparator 120. The comparator 120further includes an input that receives a clock signal CLK, with theclock signal CLK controlling the timing of the comparison between thevoltages received on the two inputs of the comparator 120 and the timingof the output of the comparator 120.

The monitoring circuit 100 further includes a binary code generator 130that generates the B code based on the comparator signal. For example,the B code has a value that approximates a magnitude of the monitoredvoltage Vin. The binary code generator 130 includes an output on whichthe binary code generator 130 outputs the B code to the C-DAC 110. In anexample, the binary code generator 130 is an up-down counter thatincrements or decrements the binary code based on the comparator signal.In another example, the binary code generator 130 is a SuccessiveApproximation Register (SAR) that adjusts the binary code based on thecomparator signal. The binary code generator 130 includes an input toinput the logic signal output by the comparator 120. The binary codegenerator 130 produces the B code in accordance with the comparatorsignal received from the comparator 120. In an example, the binary codegenerator 130 stores a count value and begins counting from a resetvalue, e.g., zero, incrementing the count value in response to receivinga logic high signal from the comparator 120 and decrementing the countvalue in response to receiving a logic low signal from the comparator120. Over a course of a number of clock cycles of the clock signal CLK,the count value will increment and decrement in accordance with thelogic signal received from the comparator 120 to converge on a multi-bitbinary value approximating the magnitude of the monitored voltage Vinthat is received by the C-DAC 110.

The monitoring circuit 100 is an ultra-low power consumption device thatdraws approximately zero static direct current (DC) from a power supplywhile not actively monitoring the monitored voltage Vin, e.g., while notperforming a conversion to approximate a magnitude of the monitoredvoltage Vin input to the C-DAC 110. In an example, the monitoringcircuit 100 only utilizes switching power, which can be controlled via afrequency of the clock signal CLK. The monitoring circuit 100 may beutilized in applications in which high precision and speed are notprioritized. In an example, the reference voltage Vref is produced by ahigh output-impedance voltage source. In an alternate example, a lowimpedance Vref source produces the reference voltage Vrefintermittently. For example, such a low impedance Vref source canoccasionally provide the reference voltage Vref during every conversionphase of the sampling circuit 100 and not during the sampling phase,thus being utilized a majority of the time to ensure that the monitoringcircuit 100 consumes ultra-low power. In an example, the monitoringcircuit 100 continuously monitors the monitored voltage Vin withoutswitching between reference voltage sources. In another example, themonitoring circuit 100 executes a duty cycle to periodically monitor themonitored voltage Vin.

In an example, the monitoring circuit 100 works with a highoutput-impedance Vref source to minimize power draw. Moreover, unlikesome existing monitoring circuits that utilize a resistor divider, themonitoring circuit 100 can create divide ratios of less than 1 with a“capacitive divider”, i.e. having a higher output voltage than is input.To create such a divide ratio, an input voltage Vin is initially putover the capacitors of the C-DAC 110 instead of 0V, and then some of thecapacitors of the C-DAC 110 are switched from 0V to the input voltageVin. This scheme can cover the “division range” of 1 to ½, i.e. up totwice as high output voltage compared to the input voltage. In anexample, this enables tracking voltages down to Vref/2, which is usefulbecause the reference voltage Vref should be as high as possible fornoise reasons. In an example, the reference voltage Vref isapproximately equal to a 1.22V bandgap voltage.

Compared to some existing monitoring devices that utilize a SAR, themonitoring circuit 100 performs sampling periodically in accordance withleakage of capacitors of the C-DAC 110. As the reference voltage Vref isonly utilized during sampling, an advantage is realized even if thereference voltage Vref is produced by low impedance reference source. Alow impedance reference source typically results in high powerconsumption. But, because the sampling only occurs periodically,sampling can be turned off a majority of time, which helps reduceaverage power consumption.

In an example, the monitoring circuit 100 continuously monitors abattery voltage while consuming extremely low power, e.g., approximatelyless than 1 uA. This power consumption is in contrast to othermonitoring circuits that monitor a battery voltage utilizing resistordividers which utilize a large area to achieve low power consumption,e.g., approximately 4-6 uA or more. Thus, this monitoring circuitconsumes approximately less power than other monitoring circuits thatrely on resistor dividers, while also utilizing a much smaller area toimplement the monitoring circuit. Moreover, because this monitoringcircuit only consumes power during a conversion phase, this device mayconsume about 10× less power than resistor divider based monitoringcircuits.

FIG. 2 illustrates another example monitoring circuit 200 that monitorsa voltage. The monitoring circuit 200 includes the structure of themonitoring circuit 100 as well as its benefits and functionality. Themonitoring circuit 200 includes a switch device Si (e.g., a transistorswitch) that selectively couples the monitoring circuit 200 to eitherthe monitored voltage Vin being monitored or the ground reference VSS.The switch device S1 selectively couples the monitoring circuit 200 toeither the monitored voltage Vin or the ground reference VSS inaccordance with a “CLK monoshot pulse” that is derived from the clocksignal CLK, but triggers such coupling periodically and less frequentlythan the cycling of the clock signal CLK, e.g., 1 CLK monoshot pulse forevery 100 conversions by a C-DAC 210. In an example, a counter (notshown) can be used to count a number of cycles of the clock signal CLK,and trigger the CLK monoshot pulse every X number of cycles of the clocksignal CLK, where X is a function of the leakage of the capacitor KC.The switch device S1 switches in accordance with the CLK monoshot pulseto couple the monitored voltage Vin to a plate of the capacitor KCcoupled to the switch device S1 to charge the capacitor KC to a voltagelevel of the monitored voltage Vin, during a conversion phase of theC-DAC 210. The switch device S1 switches in accordance with the CLKmonoshot pulse to couple the ground reference VSS to the plate of thecapacitor KC coupled to the switch device S1 to discharge the capacitorKC, during a sampling phase of the C-DAC 210.

The monitoring circuit 200 further includes the C-DAC 210 that includesa plurality of capacitors coupled in parallel. As shown in the exampleof FIG. 2, the bottom plates of the plurality of capacitors areselectively coupled to ground (e.g., by switch devices S2-S6,respectively) and the top plates of the plurality of capacitors arecoupled to a coupling that extends between the node 215 (e.g., input ofa comparator 120) and a plate of the capacitor KC. In this example, theC-DAC includes the capacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C,an output node 215, and switch devices S2-S6 that are respectivelycoupled to a plate of these capacitors opposite a side that is coupledto the node 215. Capacitor Cp is illustrated as being directly coupledto both node 215 and ground reference VSS, with capacitor Cprepresenting the parasitic capacitance within the C-DAC 110. CapacitorCp reduces an accuracy of the voltage Vdiv produced by the C-DAC 110.One side of each of the capacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C,2C, C is coupled to the node 215 and an opposite side of each of thecapacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C are selectivelycoupled to the ground reference VSS in accordance with the B code, viathe respective switch devices S2-S6.

The node 215 is coupled to a switch device S7 and to each the capacitors2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C that is coupled to thecapacitor KC. The switch device S7 also switches in accordance with theCLK monoshot pulse. The switch device S7 switches in accordance with theCLK monoshot pulse to couple a plate of the capacitor KC coupled to theswitch device S7 to ground reference VSS, during the sampling phase ofthe C-DAC 210. The switch device S7 switches in accordance with (e.g.,in response to) the CLK monoshot pulse to de-couple the plate of thecapacitor KC coupled to the switch device S7, during a conversion phaseof the C-DAC 210.

During a sampling phase of the monitoring circuit 200, switch device S1couples the plate of capacitor KC coupled to switch device S1 to theground reference VSS, switch device S7 couples node 215 to the groundreference VSS, and switch devices S2-S6 couple and the plate of selectedcapacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C (Bcode*C) coupledto switch devices S2-S6, respectively, to the ground reference VSS, withremaining capacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C beingfloated (e.g., uncoupled from the ground reference VSS). Thereafter,during the next phase of the monitoring circuit 200, the conversionphase, the switch Si couples the plate of capacitor KC coupled to switchdevice Si to the monitored voltage Vin, switch S7 uncouples node 215from the ground reference VSS to float node 215, and switch devicesS2-S6 maintain a coupling between the plate of capacitors 2.sup.N-1C,2.sup.N-2C, . . . , 4C, 2C, C (B.sub.code*C) coupled to switch devicesS2-S6 and the ground reference VSS. In an alternate example, during asampling phase of the monitoring circuit 200, switch device S1 couplesthe plate of capacitor KC coupled to switch device S1 and node 215 tothe monitored voltage Vin, and switch devices S2-S6 couple selectedplates of capacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C (Bcode*C)coupled to switch devices S2-S6 to the monitored voltage Vin, withremaining capacitors 2.sup.N-1C, 2.sup.N-2C, . . . , 4C, 2C, C beingfloated (e.g., uncoupled from monitored voltage Vin). During aconversion phase of the monitoring circuit 200, the switch device S1maintains a coupling of the plate of capacitor KC coupled to switchdevice S1 to Vin, switch S7 disconnects node 215 to float node 215, andswitch devices S2-S6 couple the plate of capacitors 2.sup.N-1C,2.sup.N-2C, . . . , 4C, 2C, C (B.sub.code*C) coupled to the switchdevices S2-S6 to ground reference VSS.

The binary code generator 130 will converge at a digital code where thevoltage Vdiv corresponds to the reference voltage Vref. This convergencemay occur at a positive edge of the clock signal CLK. As an example, thevoltage Vdiv is equal to:

${{{Vin} \times \frac{KC}{\left( {B_{code} + K} \right)C}} = {Vref}};$${{Vin} = {{Vref}\left( {1 + \frac{Bcode}{K}} \right)}};{and}$${Vin} = {{Vref}*\left( {1 + \frac{Bcode}{K} + \frac{Kp}{K}} \right)}$

where C is a unit capacitance, K is a ratio between capacitor KC andunit capacitance, and Kp is a ratio between parasitic capacitance Cp tothe unit capacitance.

FIG. 3 illustrates yet another example monitoring circuit 300 thatmonitors a voltage. The monitoring circuit 300 includes the structure ofthe monitoring circuit 100 as well as its benefits and functionality.The monitoring circuit 300 includes a switch device S8 (e.g., atransistor switch) that selectively couples the monitoring circuit 300to either the monitored voltage Vin or the reference voltage Vref. Theswitch device S8 selectively couples the monitoring circuit 300 toeither the monitored voltage Vin being monitored or the referencevoltage Vref in accordance with the CLK monoshot pulse. The switchdevice S8 switches in accordance with the CLK monoshot pulse to couplethe monitored voltage Vin to a plate of the capacitor KC coupled to theswitch device S8 to charge the capacitor KC to a voltage level of themonitored voltage Vin, during a conversion phase of the C-DAC 210. Theswitch device S8 switches in accordance with the CLK monoshot pulse tocouple the reference voltage Vref to the plate of the capacitor KCcoupled to the switch device Si to precharge node 215 to a voltage levelof the reference voltage Vref, during a sampling phase of the C-DAC 210.

The monitoring circuit 300 further includes a C-DAC 310 that includesthe plurality of capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C, anoutput node 315, and switch devices S9-S13 that are respectively coupledto a plate of these capacitors opposite a side that is coupled to thenode 315. One side of each of the capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . ., 4C, 2C, C are coupled to the node 315 and an opposite side of each ofthe capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C are selectivelycoupled to either the ground reference VSS or the reference voltage Vrefin accordance with the B code, via the switch devices S9-S13.

The node 315 is coupled to a switch device S14 and to plates of each thecapacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C coupled to thecapacitor KC. The switch device S14 also switches in accordance with theCLK monoshot pulse. The switch device S14 switches in accordance withthe CLK monoshot pulse to couple a plate of the capacitor KC coupled tothe switch device S14 to reference voltage Vref, during the samplingphase of the C-DAC 310. The switch device S14 switches in accordancewith the CLK monoshot pulse to de-couple the plate of the capacitor KCcoupled to the switch device S14, during a conversion phase of the C-DAC310.

During a sampling phase of the monitoring circuit 300, the switch deviceS8 couples the plate of capacitor KC coupled to switch device S8 to thereference voltage Vref, switch device S14 couples node 315 to thereference voltage Vref, and switch devices S9-S13 couple the plate ofselected capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C (Bcode*C)coupled to switch devices S9-S13 to the reference voltage Vref, with theplate of remaining capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, andC being floated (e.g., electrically disconnected from both VSS and Vref)during the sampling phase. Thereafter, during a conversion phase of themonitoring circuit 300, switch device S8 couples the plate of capacitorKC coupled to switch device S8 to the monitored voltage Vin, switchdevice S14 disconnects the node 315 from Vref to float node 315, andswitch devices S9-S13 couple the plates of one or more selectedcapacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, and C (B_(code)*C)coupled to switch devices S9-S13 to ground reference VSS.

A transfer function of monitoring circuit 300 results in the monitoredvoltage Vin as being a more accurate linear function of Bcode, reducingan accuracy due to parasitic capacitance CP of the B code in accordancewith the equation:

${Vin} = {{Vref}*\left( {1 + \frac{Bcode}{K}} \right)}$

FIG. 4 illustrates yet another example monitoring circuit 400 thatmonitors a voltage. The monitoring circuit 400 includes the structure ofthe monitoring circuit 100 as well as its benefits and functionality. Inthis example, the monitoring circuit 400 includes a C-DAC 410 thatincludes the capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C, anoutput node 415, and switch devices S15-S19 that are respectivelycoupled to a plate of these capacitors opposite a side at which the node415 is coupled to these capacitors. Plates of each of the capacitors 2^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C, opposite the switch deviceS15-S19 are coupled to the node 415. A plate of each of the capacitors 2^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C, coupled to switch devices S15-S19are selectively coupled to either the monitored voltage Vin, the groundreference VSS, or the reference voltage Vref, in accordance with the Bcode. The node 415 is selectively coupled to the reference voltage Vrefin accordance with the CLK monoshot pulse applied to switch S20.

During a sampling phase of the monitoring circuit 400, switch devicesS15-S20 respectively couple node 415 and the plate of all of thecapacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C coupled to switchdevices S15-S19 to the reference voltage Vref. Thereafter, during aconversion phase of the monitoring circuit 400, switch device S20disconnect the node 415 from the reference voltage Vref to float node415, and switch devices S15-S19 couple the plate of selected capacitors2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C (B_(code)*C) coupled to switchdevices S15-S19 to the monitored voltage Vin, with the switch devicesS15-S19 coupling the remaining capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . ,4C, 2C, C to the ground reference VSS.

A transfer function of monitoring circuit 400 results in the monitoredvoltage Vin as being a non-linear function of the B code in accordancewith the equation:

${Vin} = \frac{{Vref}*\left( {2^{N} - 1} \right)}{Bcode}$

Alternatively, during a sampling phase of the monitoring circuit 400selected capacitors 2Λ(N-1) C, 2Λ(N-2) C, . . . are coupled to theground reference VSS in accordance with a B_code_pre signal (e.g., areso coupled in response to a binary pre-code signal received during thesampling phase), the remaining capacitors to Vref. A transfer functionof monitoring circuit 400 for this configuration results in themonitored voltage Vin as being a non-linear function of the B_codesignal in accordance with the equation:

${Vin} = \frac{{Vref}*\left( {2^{N} - 1 - {{B\_ code}{\_ pre}}} \right)}{Bcode}$

Thereafter, in response to a binary code (B_(code)) received during aconversion phase that follows the sampling phase of the monitoringcircuit 400, switch device S20 disconnects the node 415 from thereference voltage Vref to float node 415, and switch devices S15-S19couple the plate of selected capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . ,4C, 2C, C (B_(code)*C) coupled to switch devices S15-S19 to themonitored voltage Vin, with the switch devices S15-S19 coupling theremaining capacitors 2 ^(N-1)C, 2 ^(N-2)C, . . . , 4C, 2C, C to theground reference VSS. Accordingly, the binary pre-code signal can begenerated in accordance with the equation:Vin=(Vref*(2Λ(N)−1−B_code_pre))/Bcode, where Vin is the monitoredvoltage, Vref is the reference voltage, B_code_pre is the binarypre-code, and Bcode is the binary code.

This allows a measurement of Vin, that is not limited to voltagesgreater or equal to Vref. With exception of the digital control (notshown) this does not require extra hardware to implement.

FIG. 5 illustrates an example waveform timing diagram 500 for themonitoring circuit 200 illustrated in FIG. 2. In particular, thewaveform timing diagram 500 includes a waveform of the clock signal CLK510, the analog signal Vdiv 530, and the reference voltage Vref 520. Asillustrated, the reference voltage Vref 520 is maintained at anapproximately constant voltage. The analog signal Vdiv 530 rises from alogic low signal, prior to transition of the clock signal CLK 510 from alogic low to a logic high signal, to a level of the reference voltageVref 520. Thereafter, the analog signal Vdiv 530 transitions, subsequentto transition of the clock signal CLK 510 from a logic high signal, backto a logic low signal.

In view of the foregoing structural and functional features describedabove, a method in accordance with various aspects of the presentdisclosure will be better appreciated with reference to FIG. 6. While,for purposes of simplicity of explanation, the method of FIG. 6 is shownand described as executing serially, it is to be understood andappreciated that the present disclosure is not limited by theillustrated order, as some aspects may, in accordance with the presentdisclosure, occur in different orders and/or concurrently with otheraspects from that shown and described herein. Moreover, not allillustrated features may be required to implement a method in accordancewith an aspect of the present disclosure. The example method of FIG. 6may be implemented by hardware, such as in an IC chip or a combinationof analog and/or discrete circuit components. In the example of FIG. 6,for purposes of explanation, the method 600 is described in the contextof the example system of FIG. 1. In other examples, the method 600 maybe implemented with respect to circuits and devices configureddifferently.

FIG.6 illustrates an example method 600 of monitoring a voltage. Whilefor ease of explanation, the method 600 is described in reference to theC-DAC 110 in the monitoring circuit 100 of FIG. 1, the method is equallyapplicable to each of the other example monitoring circuits disclosedherein with respect to FIGS. 2-4. At 610, the method 600 includesselectively receiving the monitored voltage Vin at an input of the C-DAC110. A switch device, e.g., switch device S1, switches in accordancewith the CLK monoshot pulse to selectively couple the monitored voltageVin to the C-DAC 110.

At 620, the method 600 includes producing an analog signal Vdiv with theC-DAC 110 based on the B code. The C-DAC 110 receives a B code, areference voltage Vref, a monitored voltage Vin, and a ground referenceVSS, with the C-DAC 110 outputting the analog signal Vdiv based on thebinary code. The C-DAC 110 receives the B code from the binary codegenerator 130.

At 630, the method 600 includes comparing the analog signal Vdiv to areference voltage in accordance with a clock signal. The comparator 120includes a first input coupled to receive the analog signal Vdiv and asecond input coupled to the reference voltage Vref. The comparator 120compares the analog signal Vdiv to the reference voltage Vref andoutputs a comparator signal based on the comparison.

At 640, the method 600 includes producing the binary code based on thecomparison of the analog signal to the reference voltage Vref, with theB code approximating a magnitude of the monitored voltage Vin. Thebinary code generator 130 generates the B code based on the comparatorsignal, with the B code approximating a magnitude of the monitoredvoltage Vin.

What have been described above are examples of the disclosure. It is, ofcourse, not possible to describe every conceivable combination ofcomponents or method for purposes of describing the disclosure, but oneof ordinary skill in the art will recognize that many furthercombinations and permutations of the disclosure are possible. As usedherein, the term “based on” means based at least in part on.Accordingly, the disclosure is intended to embrace all such alterations,modifications, and variations that fall within the scope of thisapplication, including the appended claims.

What is claimed is:
 1. A monitoring circuit, comprising: a capacitivedigital-to-analog converter including a plurality of capacitors, and thecapacitive digital-to-analog converter configured to receive a binarycode, a reference voltage, an input voltage, and a ground reference, thecapacitive digital-to-analog converter configured to output an analogsignal based on the binary code, the reference voltage, the inputvoltage, and the ground reference; the plurality of capacitors eachincluding a respective first plate and a respective second plate, thefirst plates each configured to be coupled to the reference voltageduring a sampling phase, and to be selectively coupled to the groundreference or to the input voltage in response to the binary code duringa conversion phase; a comparator including a first input and a secondinput, the second plates collectively coupled to output the analogsignal to the first input, the second input at the reference voltage,the comparator configured to compare the first input to the second inputand to output a comparator signal based on the comparison; and a binarycode generator configured to generate the binary code based on thecomparator signal, the binary code related to a magnitude of the inputvoltage.
 2. The circuit of claim 1, wherein the binary code generator isan up-down counter that increments or decrements the binary code basedon the comparator signal.
 3. The circuit of claim 1, wherein the binarycode generator is a successive approximation register that adjusts thebinary code based on the comparator signal.
 4. The circuit of claim 1,further comprising a plurality of switches configured to, during theconversion phase, selectively couple each of the first plates to theground reference or the first input voltage in accordance with thebinary code.
 5. The circuit of claim 1, wherein the input voltage is abattery voltage.
 6. The circuit of claim 1, wherein the input voltage isfrom a battery.
 7. A monitoring method, comprising: selectivelyreceiving an input voltage at an input of a capacitive digital-to-analogconverter that includes a plurality of capacitors, the capacitors eachincluding a respective first plate and a respective second plate;coupling each of the first plates to a reference voltage in a samplingphase, and selectively coupling each of the first plates to a groundreference or to the input voltage in response to a binary code in aconversion phase; producing an analog signal by said second plates;comparing the analog signal to the reference voltage in accordance witha clock signal; and producing the binary code based on the comparison ofthe analog signal to the reference voltage, the binary code related to amagnitude of the input voltage.
 8. The monitoring method of claim 7, themethod further comprising selectively coupling or decoupling each of theplurality of capacitors to/from the ground reference in accordance withthe binary code.
 9. The monitoring method of claim 7, the method furthercomprising selectively coupling or decoupling each of the plurality ofcapacitors to/from the ground reference and the input voltage, inaccordance with the binary code.
 10. A monitoring device, comprising: aplurality of capacitors coupled in parallel with each other, each of thecapacitors including a respective first plate and a respective secondplate, each of the first plates being selectively coupled to ordecoupled from a ground reference, a reference voltage, and an inputvoltage in accordance with a binary code to provide an analog signal ata node coupled to the plurality of second plates; a plurality of switchdevices to couple each of the plurality of first plates to the referencevoltage in accordance during a sampling phase, and to selectively coupleeach of the plurality of first plates to the ground reference or to theinput voltage in accordance with the binary code during a conversionphase; a comparator including a first input coupled to the node and asecond input coupled to the reference voltage, the comparator comparingthe first input to the second input and outputting a comparator signalbased on the comparison; and a binary code generator that generates thebinary code based on the comparator signal, the binary code relating toa magnitude of the input voltage.
 11. The monitoring device of claim 10,wherein the plurality of switch devices further selectively couple anddecouple each of the plurality of capacitors to/from the referencevoltage in accordance with the binary code.
 12. The monitoring device ofclaim 10, wherein the binary code generator is one of an up-down counterthat increments or decrements the binary code based on the comparatorsignal or a successive approximation register that adjusts the binarycode based on the comparator signal.